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What is EOS (Electrical Overstress)?
2020/10/13
EOS meant Electrical Overstress (EOS)
EOS is the number one cause of damage to IC components. When the current (or voltage) that the device bears exceeds the device specification limit, causing local high temperatures, which can cause destructive damage to the materials used in the device structure. This phenomenon is called electrical overstress.
Most people are quite familiar with ESD and its adverse effects on electronic equipment and components. EOS, while technically encompassing ESD, is differentiated from ESD in a number of ways:
ESD:
*Caused by a rapid discharge of accumulated electrical charge. Once this accumulated charge is consumed, ESD Event can no longer manifest itself.
*Characterized by a specific waveform. While the waveforms of different models of ESD Events (CDM, HBM, MM and others) certainly differ in appearance, in general their properties include rapid rising edge (within few nanoseconds) and an asymptotic rear edge lasting typically less than 100nS.
*Non-periodic and non-repeatable – accumulation of charges cannot be guaranteed.
EOS:
*Caused by voltage and/or currents associated with operation of equipment or with power generating equipment. Lasts as long as the originating signal exists. There is no inherent limitation on its.
*Can technically have any physically possible waveform – the sources of EOS are often unpredictable. There are some major categories, however, which will be described further in the text.
*Mostly, but not always, periodic and repeatable.
EOS is the number one cause of damage to IC components. When the current (or voltage) that the device bears exceeds the device specification limit, causing local high temperatures, which can cause destructive damage to the materials used in the device structure. This phenomenon is called electrical overstress.
Most people are quite familiar with ESD and its adverse effects on electronic equipment and components. EOS, while technically encompassing ESD, is differentiated from ESD in a number of ways:
ESD:
*Caused by a rapid discharge of accumulated electrical charge. Once this accumulated charge is consumed, ESD Event can no longer manifest itself.
*Characterized by a specific waveform. While the waveforms of different models of ESD Events (CDM, HBM, MM and others) certainly differ in appearance, in general their properties include rapid rising edge (within few nanoseconds) and an asymptotic rear edge lasting typically less than 100nS.
*Non-periodic and non-repeatable – accumulation of charges cannot be guaranteed.
EOS:
*Caused by voltage and/or currents associated with operation of equipment or with power generating equipment. Lasts as long as the originating signal exists. There is no inherent limitation on its.
*Can technically have any physically possible waveform – the sources of EOS are often unpredictable. There are some major categories, however, which will be described further in the text.
*Mostly, but not always, periodic and repeatable.
